논문제목[Vol. 48] KJM048-04-07 Byeong-Seon An, Yeon Ju Shin, Jae-Seon Ju, and Cheol-Woong Yang*|Transmission Electron Microscopy Specimen Preparation for Two Dimensional Material Using Electron Beam Induced Deposition of a Protective Layer in the Focused Ion Beam
저자Byeong-Seon An, Yeon Ju Shin, Jae-Seon Ju, and Cheol-Woong Yang*|Transmission Electron Microscopy Specimen Preparation for Two Dimensional Material Using Electron Beam Induced Deposition of a Protective Layer in the Focused Ion Beam